US Patent Issued to Hitachi on Sept. 8 for "Abnormality determination computer and abnormality determination method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,246, issued on Sept. 8, was assigned to Hitachi Ltd. (Tokyo).

"Abnormality determination computer and abnormality determination method" was invented by Atsushi Miyamoto (Tokyo), Hiromi Nishiura (Tokyo), Naoaki Kondo (Tokyo) and Akira Ito (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "In anomaly determination using an autoencoder, the present invention enables highly accurate anomaly determination with respect to an unknown anomaly image, even in the case of learning using only a non-defective image. In a learning step of learning a parameter of the autoencoder using a non-defective learning image /{f_i/} captured of a non-defective test targe...