US Patent Issued to HITACHI on Oct. 6 for "Data analysis system and method" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,756,194, issued on Oct. 6, was assigned to HITACHI LTD. (Tokyo).

"Data analysis system and method" was invented by Kazuki Namba (Tokyo), Masato Utsumi (Tokyo), Tohru Watanabe (Tokyo), Ikuo Shigemori (Tokyo), Hiroshi Iimura (Tokyo), Daisuke Hamaba (Tokyo), Dan Zhao (Tokyo), Hiroaki Ogawa (Tokyo) and Jun Yamazaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system generates a first tree structure representing a relation of a plurality of measurement data sets, and generates goodness-of-fit data based on at least a part of attribute data regarding one or more branch portions included in the first tree structure. The attribute data includes one or...