US Patent Issued to Hitachi on May 19 for "Abnormality degree calculation system and abnormality degree calculation method" (Japanese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,632,780, issued on May 19, was assigned to Hitachi Ltd. (Tokyo).

"Abnormality degree calculation system and abnormality degree calculation method" was invented by Kota Dohi (Tokyo), Takashi Endo (Tokyo) and Yohei Kawaguchi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality degree calculation system includes a concept classification assignment unit that assigns a predetermined concept classification based on an identification number of a target device, a feature value vector extraction unit that extracts a feature value vector based on sensor data of a sensor corresponding to the target device, a likelihood calculation unit that calculat...