US Patent Issued to Hitachi on July 14 for "Fault tree generation device and fault tree generation method" (Japanese Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,262, issued on July 14, was assigned to Hitachi Ltd. (Tokyo).

"Fault tree generation device and fault tree generation method" was invented by Yuuki Shimizu (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A fault tree in which causes for failure events are appropriately developed is generated. A fault tree generation device according to the present invention includes a formula database that stores formulas related to physical phenomena, a formula base causal model generation unit that generates a causal relationship of failure events based on the formulas, a formula base fault tree generation unit that generates a formula base fault tree that i...