US Patent Issued to HITACHI on April 7 for "System for learning new visual inspection tasks using a few-shot meta-learning method" (California Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,232, issued on April 7, was assigned to HITACHI LTD. (Tokyo).

"System for learning new visual inspection tasks using a few-shot meta-learning method" was invented by Lasitha Sandaruwan Vidyaratne (Fremont, Calif.), Xian Yeow Lee (Santa Clara, Calif.), Mahbubul Alam (Fremont, Calif.), Ahmed Farahat (Santa Clara, Calif.), Dipanjan Ghosh (Santa Clara, Calif.), Maria Teresa Gonzalez Diaz (Mountain View, Calif.) and Chetan Gupta (Sunnyvale, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods described herein which can involve for a first input of a plurality of labeled images of a new domain task, processing the first plurality of l...