US Patent Issued to HITACHI on April 21 for "Shadow image and scattered intensity for particle measuring apparatus and particle measuring method" (Japanese Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,548, issued on April 21, was assigned to HITACHI LTD. (Tokyo).

"Shadow image and scattered intensity for particle measuring apparatus and particle measuring method" was invented by Tomonari Misawa (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Particle size measurement and material discrimination can be performed simultaneously with a less expensive configuration. A particle measuring apparatus includes: a first light source and a second light source that irradiate a sample containing particles of a predetermined material with parallel light; an imaging unit that captures a scattered light image of the particles by the parallel light emitted...