US Patent Issued to HITACHI INDUSTRIAL EQUIPMENT SYSTEMS on March 3 for "Abnormality diagnosis system and abnormality diagnosis method" (Japanese Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,432, issued on March 3, was assigned to HITACHI INDUSTRIAL EQUIPMENT SYSTEMS Co. LTD. (Tokyo).

"Abnormality diagnosis system and abnormality diagnosis method" was invented by Masayoshi Ojima (Tokyo), Masahiro Yamazaki (Tokyo), Kenji Sato (Tokyo), Yutaka Kobayashi (Tokyo) and Hideyuki Gotou (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A data analysis unit includes a validity determination unit that calculates a determination factor for determining the validity of a data analysis process to determine the validity of the data analysis process, and displays the validity determination result on a display device."

The patent was filed on Aug. 24...