ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,860, issued on May 5, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).
"Automatic analysis device" was invented by Chie Yabutani (Tokyo), Takumi Yamada (Tokyo) and Masahiko Iijima (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An automatic analysis device is provided with: a sample disk for holding a sample container that accommodates a sample; a reagent disk for holding a reagent container that accommodates a reagent; at least two different measuring units that respectively perform different types of analyses; a control part that controls the measuring units; and a display part that displays: a work flow area in which the flow of operation of ...