US Patent Issued to Hitachi High-Tech on May 26 for "Ion source and mass spectrometer including the same" (Japanese Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,640,356, issued on May 26, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Ion source and mass spectrometer including the same" was invented by Yasushi Terui (Tokyo) and Kantarou Maruoka (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An ion source includes: an atomizer configured to continuously introduce a liquid sample and atomize the liquid sample; a heating and mixing chamber configured to vaporize the atomized liquid sample; and a charge supply unit configured to ionize the vaporized liquid sample. The charge supply unit has a positive pressure with respect to the heating and mixing chamber. The vaporized liquid sample and a gaseous seed io...