ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,980, issued on March 31, was assigned to Hitachi High-Tech Corp. (Tokyo).
"Automatic analysis device" was invented by Yoko Makino (Tokyo), Masashi Shibahara (Tokyo) and Toshiki Yamagata (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An automatic analysis device includes a control unit, a switch, a reagent jacket, and a sliding contact mechanism. The control unit is configured to drive a motor that rotates the rotation shaft to rotate the reagent jacket. The switch is configured to switch the sliding contact mechanism between a state of the scraper being in contact with an inner wall surface of the housing and a state of the scraper being spa...