US Patent Issued to HITACHI HIGH-TECH on March 24 for "Automatic analyzer and control program for automatic analyzer" (Japanese Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,933, issued on March 24, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Automatic analyzer and control program for automatic analyzer" was invented by Yuichiro Ota (Tokyo), Kenta Imai (Tokyo), Shunsuke Sasaki (Tokyo), Hidekazu Tezuka (Tokyo) and Hiroya Umeki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention has an object to provide an automatic analyzer and a control program that can shorten total analysis time. The automatic analyzer comprises: a sample rack that houses a sample; a sample dispensing mechanism that aspirates the sample from the sample rack and dispenses the sample into a reaction container; a plurality of detec...