US Patent Issued to HITACHI HIGH-TECH on March 24 for "Analysis system and analysis method using same" (Japanese Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,586,032, issued on March 24, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Analysis system and analysis method using same" was invented by Hirokazu Kato (Tokyo), Motohiro Yamazaki (Tokyo), Ryusuke Kimura (Tokyo), Noriyuki Sumida (Tokyo), Hiroyuki Tanai (Tokyo), Asami Terakado (Tokyo) and Mitsuhiro Miyazaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis system includes: an analyzer that performs an analysis using polymer filled in a polymer cartridge, acquires attribute information on the polymer cartridge, and transmits the attribute information to the outside; and a server that acquires the attribute information on the polymer c...