US Patent Issued to Hitachi High-Tech on July 7 for "Sample holder and electron microscope" (Japanese Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,281, issued on July 7, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Sample holder and electron microscope" was invented by Yuji Asakura (Tokyo), Michio Hatano (Tokyo) and Mitsuhiro Nakamura (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The performance of a sample holder that is fillable with a liquid sample is improved. A sample holder 200 includes: an upper tip 300 that is disposed on an irradiation side of an electron beam; and a lower tip 400 that is disposed to face the upper tip 300. At this time, the sample holder 200 includes: a diaphragm 350 that is provided in the upper tip 300; a diaphragm 450 that is provided in the lower tip ...