ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,412, issued on Jan. 27, was assigned to Hitachi High-Tech Corp. (Tokyo).
"Far-infrared spectroscopy device and sample adapter" was invented by Mizuki Mohara (Tokyo), Kei Shimura (Tokyo), Touya Ono (Tokyo) and Kenji Aiko (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a far-infrared spectroscopy device and sample adapter that make it possible to highly accurately measure a sample that is not flat. A far-infrared spectroscopy device according to this invention comprises an illumination optical system for concentrating far-infrared light onto a sample and a detector for detecting light that has passed through the sample. Sample adapt...