ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,709, issued on Jan. 20, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).
"Automatic analysis device" was invented by Daisuke Ebihara (Tokyo), Shinya Matsuoka (Tokyo) and Taku Sakazume (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "The automatic analysis device includes an evaporative concentration unit configured to perform a concentration process of evaporating an extract solution obtained by extracting a component to be analyzed in a sample to concentrate the component to be analyzed; an analysis unit configured to analyze the component to be analyzed of the sample; and a control unit configured to control operations of the analysis unit an...