US Patent Issued to HITACHI HIGH-TECH on Feb. 17 for "Error cause estimation device and estimation method" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,554,571, issued on Feb. 17, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Error cause estimation device and estimation method" was invented by Yasuhiro Yoshida (Tokyo), Masayoshi Ishikawa (Tokyo), Kouichi Hayakawa (Tokyo), Masami Takano (Tokyo) and Fumihiro Sasajima (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An error cause estimation device comprises a feature value generation unit for using data transmitted from the outside to generate feature values suitable for a machine learning model; a model database having a plurality of error prediction models, for determining whether an error has occurred using the feature values as input data; a...