US Patent Issued to Hitachi High-Tech on Feb. 10 for "Mass spectrometer" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,548,749, issued on Feb. 10, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Mass spectrometer" was invented by Yuka Sugawara (Tokyo), Masuyuki Sugiyama (Tokyo), Yuichiro Hashimoto (Tokyo), Hiroyuki Yasuda (Tokyo) and Riku Tamura (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "To provide a mass spectrometer for higher ion permeation efficiency. In a mass spectrometer to transfer ions generated in an ion source 101 to a detector 106 through a vacuum chamber equipped with electrodes, the vacuum chamber includes a first vacuum chamber 107 and a second vacuum chamber 108 communicated by a pore 104 and an air flow containing ions introduced from the i...