US Patent Issued to HITACHI ASTEMO on Feb. 17 for "Visual inspection apparatus and visual inspection method" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,833, issued on Feb. 17, was assigned to HITACHI ASTEMO LTD. (Ibaraki, Japan).

"Visual inspection apparatus and visual inspection method" was invented by Shinichi Inoue (Hitachinaka, Japan), Takateru Seki (Hitachinaka, Japan), Takamasa Imaizumi (Hitachinaka, Japan) and Hiroyuki Hayashi (Hitachinaka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A visual inspection apparatus detects a defect candidate for each of captured images of a crown surface of a piston that are captured at a plurality of posture angles different from one another, locates a three-dimensional position of the defect candidate based on a two-dimensional position of the defec...