US Patent Issued to HITACHI ASTEMO on Aug. 4 for "Pose change apparatus and inspection method" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,040, issued on Aug. 4, was assigned to HITACHI ASTEMO LTD. (Ibaraki, Japan).

"Pose change apparatus and inspection method" was invented by Yoshiaki Hirai (Hitachinaka, Japan), Hiroki Morii (Hitachinaka, Japan), Takamasa Imaizumi (Hitachinaka, Japan) and Hiroyuki Hayashi (Hitachinaka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A pose change apparatus includes a first output shaft rotatable around a first rotational axis, a first member rotatable around the first output shaft according to a rotation of the first output shaft, a second output shaft disposed on the first member and rotatable around a second rotational axis tilted at an angle wi...