ALEXANDRIA, Va., May 26 -- United States Patent no. 12,639,403, issued on May 26, was assigned to Hewlett Packard Enterprise Development LP (Spring, Texas).

"Testing and baselining a machine learning model and test data" was invented by Sarath Gollapudi (Bangalore, India), Pooja Sambhaji Ayanile (Latur, India), Sabyasachi Mukhopadhyay (Bangalore, India), Sanjeev Kumar Mishra (Bangalore, India), Rakshith N (Puttur, India), Subhabrata Banerjee (Bangalore, India) and Darshan Tirumale Dhanaraj (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device may receive a machine learning model, training data, and test data, and may perform a unit test on the machine learning model to generate unit test ...