ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,491, issued on Sept. 15, was assigned to Hewlett-Packard Development Co. LP (Spring, Texas).
"Thermal resistance determination" was invented by Fu-Yi Chen (Taipei City, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "In an example, an electronic device includes an electronic component with a temperature sensor to measure a first operating temperature of the electronic component at a first operating state having a first power value; and measure a second operating temperature of the electronic component at a second operating state having a second power value. The electronic device includes a controller to determine a first delta between the fir...