ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,431, issued on Oct. 6, was assigned to Hefei ImagEx Electronics Technology Co. Ltd. (Hefei City, China).
"Virtual binocular detection device and chip pin warpage detection method" was invented by Fei Zheng (Hefei City, China), Guicheng Lin (Hefei City, China), Jingzhu Hong (Hefei City, China), Haishuang He (Hefei City, China) and Shuangquan Rong (Hefei City, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention discloses a virtual binocular detection device and a chip pin warpage detection method, and belongs to the technical field of chip detection. The virtual binocular detection device is configured to perform imaging detectio...