ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,681, issued on Sept. 29, was assigned to HARNESS INC. (San Francisco).
"Intelligent concurrent testing for test cycle time reduction" was invented by Hemanth Mantri (San Francisco), Rutvij Mehta (San Francisco) and Dinesh Garg (Hayward, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system that automatically reduces the time to execute software testing through intelligent test selection and execution. The system automatically detects what tests to execute based on code that has been changed, which is a subset of the entire list of tests to run for the block of code. Once the subset of tests is identified, annotations for tests are processe...