ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,399,806, issued on Aug. 26, was assigned to Harenss Inc. (San Francisco).
"Test cycle time reduction and optimization" was invented by Shivakumar Ningappa (Milpitas, Calif.), Uri Scheiner (Pleasanton, Calif.), Srinivas Bandi Ramesh Babu (Los Altos, Calif.) and Srinivasa Rao Gurubelli (Fremont, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system that automatically reduces test cycle time to save resources and developer time. The present system selects a subset of tests from a full test plan that should be selected for a particular test cycle, rather than running the entire test plan. The subset of tests is intelligently selected using metrics ...