US Patent Issued to HANGZHOU SIZONE ELECTRONIC TECHNOLOGY on Jan. 27 for "Wafer position detection device" (Chinese Inventor)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,538,742, issued on Jan. 27, was assigned to HANGZHOU SIZONE ELECTRONIC TECHNOLOGY INC. (Zhejiang, China).

"Wafer position detection device" was invented by Xiaoyu Xu (Zhejiang, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention discloses a wafer position detection device comprising a mounting base, a trigger component and a fluid pressure detection component; the trigger component arranged on the mounting base comprises a top cover protruding from a surface of the mounting base, and a fluid delivery pipeline formed in an inner wall of the top cover; when a wafer is arranged on the top cover, the top cover moves in the direction close to ...