ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,504,475, issued on Dec. 23, was assigned to Hamilton Sundstrand Corp. (Charlotte, N.C.).
"Fail open detection" was invented by Alex Gomes (Chicago) and Joshua C. Swenson (Rockford, Ill.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system includes a solid state power controller (SSPC) including a plurality of switching devices connected in parallel. A gate driver is operatively connected to control the plurality switching devices together so all of the switching devices in the plurality of switching devices either close to pass current through the SSPC, or open to prevent current passing through the SSPC in a normal operation mode. A fail open test c...