US Patent Issued to HAMAMATSU PHOTONICS on Sept. 15 for "Incline estimation system, incline estimation method, incline estimation program, semiconductor inspection system, and organism observation system" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,916, issued on Sept. 15, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).

"Incline estimation system, incline estimation method, incline estimation program, semiconductor inspection system, and organism observation system" was invented by Akari Ito (Hamamatsu, Japan) and Tomochika Takeshima (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inclination estimation system is a system for estimating the inclination of an imaging target captured in an image, and includes: an estimation target image acquisition unit for acquiring estimation target images from the image; a focal position estimation unit for outputting feature...