US Patent Issued to HAMAMATSU PHOTONICS on May 12 for "Sample observation device and sample observation method" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,475, issued on May 12, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).

"Sample observation device and sample observation method" was invented by Satoshi Yamamoto (Hamamatsu, Japan) and Masanori Matsubara (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a sample observation device, an image acquisition unit 6 acquires a plurality of pieces of image data of a sample in a Y-axis direction, and an image generation unit generates luminance image data on luminance of the sample on the basis of the plurality of pieces of image data, binarizes luminance values of each of the plurality of pieces of image data to generate a plur...