US Patent Issued to HAMAMATSU PHOTONICS on July 14 for "Optical heterodyne interference measurement device and optical heterodyne interference measurement method" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,807, issued on July 14, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).

"Optical heterodyne interference measurement device and optical heterodyne interference measurement method" was invented by Naoaki Kato (Hamamatsu, Japan), Yuu Takiguchi (Hamamatsu, Japan) and Hiroshi Tanaka (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical heterodyne interference measurement apparatus includes a beam generation unit, a beam splitter, a mirror, a first photodetector, a linear polarizer, a second photodetector, a linear polarizer, an AD conversion unit, and a computer. The beam generation unit generates and outputs a first l...