US Patent Issued to HAMAMATSU PHOTONICS on Feb. 17 for "Attenuated total reflectance spectroscopy apparatus, and attenuated total reflectance spectroscopy method" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,811, issued on Feb. 17, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).

"Attenuated total reflectance spectroscopy apparatus, and attenuated total reflectance spectroscopy method" was invented by Kazuki Horita (Hamamatsu, Japan), Kouichiro Akiyama (Hamamatsu, Japan), Yoichi Kawada (Hamamatsu, Japan) and Hiroshi Satozono (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An ATR apparatus includes a prism having a reflection surface, a holding unit holding a sample including a suspension on the reflection surface, and an adjustment unit adjusting a fluidal state of the sample held on the reflection surface. The adjustment un...