ALEXANDRIA, Va., April 21 -- United States Patent no. 12,610,635, issued on April 21, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).
"X-ray detection device" was invented by Minoru Ichikawa (Hamamatsu, Japan) and Kazuki Fujita (Hamamatsu, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray detection device includes a capillary, an X-ray detection element, and a detection circuit. The capillary has a plurality of X-ray passing regions. The X-ray detection element has a conversion portion and a plurality of pixel electrode portions. The conversion portion faces the capillary and absorbs X-rays to generate carriers. The detection circuit detects carriers collected from the conversion por...