US Patent Issued to HAMAMATSU PHOTONICS on April 14 for "Sample observation device and sample observation method" (Japanese Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,604,110, issued on April 14, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).

"Sample observation device and sample observation method" was invented by Satoshi Yamamoto (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a sample observation device, an image capturing unit includes an area image sensor that performs image capturing by the rolling shutter method in which a start of an exposure period of each of pixel columns in a pixel region is shifted by a predetermined time, and a generation unit sets one pixel column of the pixel columns as a reference pixel column, and combines a data portion corresponding to an exposure...