US Patent Issued to HACH LANGE on Oct. 20 for "Photometric process measurement apparatus" (German Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,795, issued on Oct. 20, was assigned to HACH LANGE GMBH (Berlin).

"Photometric process measurement apparatus" was invented by Andre Naggies (Berlin), Axel Leyer (Berlin) and Oriol Gili De Villasante (Berlin).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention refers to a photometric process measurement arrangement (10) with a photometric immersion probe (20) being electrically supplied with a probe supply voltage (Us) and comprising: a photometer flashlight source (61), an impulse energy capacitor (33), an electronic flyback-converter (30) for successively electrically charging the impulse energy capacitor (33) with numerous charging voltage...