ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,561,784, issued on Feb. 24, was assigned to GOERTEK INC. (Shandong, China).
"Defect detection method and device for an LCD screen" was invented by Xiaoman Wang (Shandong, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "A defect detection method for an LCD screen includes acquiring a screen image of the LCD screen, performing a rough search for defects in the screen image to extract a suspected area where the defects are located, (based on the suspected area) clustering every pixel point in the suspected area to obtain clustering results, and each clustering result corresponds to a suspected defect, and (according to the clustering result) calculati...