US Patent Issued to GM Global Technology Operations on Oct. 20 for "Combined magnetic force dilatometry with X-ray diffraction" (Michigan Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,814, issued on Oct. 20, was assigned to GM Global Technology Operations LLC (Detroit).

"Combined magnetic force dilatometry with X-ray diffraction" was invented by Robert D. Schmidt (Bloomfield Hills, Mich.), Nicholas Paul William Pieczonka (Troy, Mich.), Ratandeep Singh Kukreja (Auburn Hills, Mich.) and Devendrasinh Darbar (Sterling Heights, Mich.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes determining a total expansion value for a coin cell based on processing of first sensor data captured by a magnetic force dilatometry sensor. The first sensor data is representative of the coin cell during a cycling program of the coin cell ...