ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,209, issued on March 3, was assigned to GlobalFoundries U.S. Inc. (Malta, N.Y.).
"Test tray system and related method" was invented by Jae Hoon Kim (Cary, N.C.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test tray system for electronics, like photonics integrated circuit (PIC) structures, and a related method are disclosed. The test tray system includes at least one test tray. Each test tray includes a first section exposing a first electrical component to a high temperature, and a second section covered by a thermal protection element configured to prevent a second component from being exposed to the high temperature at the same time that the ...