US Patent Issued to GIST (Gwangju Institute of Science and Technology) on April 21 for "View extrapolation method using epipolar plane image" (South Korean Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,880, issued on April 21, was assigned to GIST (Gwangju Institute of Science and Technology) (Gwangju, South Korea).

"View extrapolation method using epipolar plane image" was invented by Hae-Gon Jeon (Gwangju, South Korea) and Hyunjun Jung (Gwangju, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to a method of inferring an epipolar plane image and extrapolating a view of a target image using the epipolar plane image. A view extrapolation method using an epipolar plane image according to an embodiment of the present disclosure includes: creating an Epipolar Plane Image (EPI) using a target image and a depth...