US Patent Issued to Georgia Tech Research on May 5 for "System and methods for measuring arc duration" (Georgia Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,903, issued on May 5, was assigned to Georgia Tech Research Corp. (Atlanta).

"System and methods for measuring arc duration" was invented by Ning Guo (Atlanta), Abdul Raheem Beyah (Atlanta), Morris Cohen (Atlanta), Lukas Graber (Atlanta), Roderick Gray (Atlanta), Samuel Neall (Atlanta) and Kevin Whitmore (Atlanta).

According to the abstract* released by the U.S. Patent & Trademark Office: "An example method of estimating an arc duration in a circuit breaker includes receiving a first measurement corresponding to a low-frequency electric field emitted from a vacuum circuit breaker during an interruption or circuit break operation and a second measurement corresponding to a low-frequ...