US Patent Issued to General Electric on July 28 for "Electromagnetic inspection systems and methods" (Indian, American Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,228, issued on July 28, was assigned to General Electric Co. (Evendale, Ohio).

"Electromagnetic inspection systems and methods" was invented by Esha Sen Gupta (Bengaluru, India), Aditya Kulkarni (Bengaluru, India), Mamatha Nagesh (Bengaluru, India), Bernard P. Bewlay (Niskayuna, N.Y.) and Ambarish J. Kulkarni (Niskayuna, N.Y.).

According to the abstract* released by the U.S. Patent & Trademark Office: "In some embodiments, a system for evaluation a coating, such as a thermal barrier coating, includes an electromagnetic inspection device and a controller in operative communication with the electromagnetic inspection device. The electromagnetic inspection device includes an electro...