US Patent Issued to General Electric, Bruker Nano on Feb. 24 for "Inspection apparatus and method for inspecting a component" (American, German, Indian Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,562, issued on Feb. 24, was assigned to General Electric Co. (Evendale, Ohio) and Bruker Nano GmbH (Berlin).

"Inspection apparatus and method for inspecting a component" was invented by Richard DiDomizio (Charlton, N.Y.), Michael Christopher Andersen (Cincinnati), Walter Vincent Dixon III (Delanson, N.Y.), Timothy Hanlon (Glenmont, N.Y.), Wayne Lee Lawrence (Sardinia, Ohio), Ramkumar Kashyap Oruganti (Bangalore, India), Jonathan Rutherford Owens (Glenville, N.Y.), Daniel M. Ruscitto (Niskayuna, N.Y.), Adarsh Shukla (Bangalore, India), Eric John Telfeyan (Delanson, N.Y.), Gregory Donald Crim (Middletown, Ohio), Michael Wylie Krauss (Cincinnati), Andre Dziurla (Berlin), Sven Martin ...