ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,779, issued on May 5, was assigned to Genentech Inc. (South San Francisco, Calif.).
"Fluorescent ellman assay for free thiol detection" was invented by Aron Lee (South San Francisco, Calif.), Rashmi Sharma (South San Francisco, Calif.), Justin Joo-Ho Jeong (South San Francisco, Calif.) and Michael Tae-Jong Kim (South San Francisco, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to methods and kits for detecting a free thiol in a substrate as well as methods for quantifying the amount of free thiol in a substrate. In particular, the present disclosure provides a fluorescent Ellman assay for enhanced sensitivity of ...