US Patent Issued to GENENTECH on Feb. 17 for "Spatial feature analysis for digital pathology images" (California Inventor)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,555,226, issued on Feb. 17, was assigned to GENENTECH INC. (South San Francisco, Calif.).

"Spatial feature analysis for digital pathology images" was invented by Xiao Li (Foster City, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods relate to processing digital pathology images. More specifically, depictions of objects of a first class (e.g., lymphocytes) and depictions of objects of a second class (e.g., tumor cells) are detected. Locations of each biological object depiction are identified, which are used to generate multiple spatial-distribution metrics that characterize where depictions of objects of a first class are locate...