US Patent Issued to GE Precision Healthcare on March 3 for "System and method for obtaining accurate measurements and quantification of x-ray image from estimation of key anatomical locations" (American, Hungarian Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,567,172, issued on March 3, was assigned to GE Precision Healthcare LLC (Wauwatosa, Wis.).

"System and method for obtaining accurate measurements and quantification of x-ray image from estimation of key anatomical locations" was invented by Gireesha Chinthamani Rao (Pewaukee, Wis.), Ravi Soni (San Ramon, Calif.), Gopal B. Avinash (Concord, Calif.), Poonam Dalal (Brookfield, Wis.), Chen Liu (Mountain View, Calif.), Molin Zhang (Cambridge, Mass.) and Zita Herczeg (Szeged, Hungary).

According to the abstract* released by the U.S. Patent & Trademark Office: "An artificial intelligence (AI) measurement system for an X-ray image is employed either as a component of the X-ray imaging system...