ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,193, issued on April 21, was assigned to GE PRECISION HEALTHCARE LLC (Waukesha, Wis.).

"Systems and methods for a multi-parameter sampling tool" was invented by Tanguy Thierry Boucneau (Versailles, France), Sofiene Bourghes (Paris), Nicolas Gogin (Chatenay-Malabry, France), Adeline Digard-Bahuon (Bonnelles, France) and Jorge Eduardo Hernandez Londono (Versailles, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system may include a processor-based device storing or accessing an image review application, which when executed by the processor-based device, causes acts to be performed such as retrieving image data for populating a graphical user...