US Patent Issued to FURUKAWA ELECTRIC on May 20 for "Radiation probe with radial scatter regions with various intensities" (Japanese Inventor)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,426, issued on May 20, was assigned to FURUKAWA ELECTRIC Co. LTD. (Tokyo).

"Radiation probe with radial scatter regions with various intensities" was invented by Masaki Iwama (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A radiation probe includes: an optical fiber including a leak section configured to output leaking light to an outer side in a radial direction as at least a part of a section in a longitudinal direction. The optical fiber includes a scattering area configured to generate the leaking light by scattering light in a predetermined area in a circumferential direction of the optical fiber in the leak section, and the optical fibe...