US Patent Issued to Fujitsu on Oct. 28 for "Apparatus and method for measuring nonlinear system noises" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,457,041, issued on Oct. 28, was assigned to Fujitsu Ltd. (Kawasaki, Japan).

"Apparatus and method for measuring nonlinear system noises" was invented by Jingnan Li (Beijing) and Zhenning Tao (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus and method to measure nonlinear system noises may include a processor to generate a bilateral notch signal, a unilateral notch signal and a multi-tone signal; to measure power of an additive Gaussian white noise of a nonlinear system by using the multi-tone signal; to measure a first power-to-noise ratio of the nonlinear system by using the bilateral notch signal; to measure a second power-to-noise...