US Patent Issued to FUJIFILM on Nov. 11 for "Image analysis device, image analysis method, and image analysis program" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,126, issued on Nov. 11, was assigned to FUJIFILM Corp. (Tokyo).

"Image analysis device, image analysis method, and image analysis program" was invented by Toru Shirai (Chiba, Japan), Ryota Satoh (Chiba, Japan), Tomoki Amemiya (Chiba, Japan) and Yoshitaka Bito (Chiba, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An image including contrast is standardized and an area is divided, a measurement cross section that most matches a measurement cross section determined to be appropriate for measuring a predetermined index is determined based on a feature of a notable tissue in the divided area, and a measurement value serving as an index is calculat...