US Patent Issued to FUJIFILM on May 20 for "Defect inspection device, defect inspection method, and program, and printing device and method of manufacturing printed matter" (Japanese Inventor)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,304,220, issued on May 20, was assigned to FUJIFILM Corp. (Tokyo).

"Defect inspection device, defect inspection method, and program, and printing device and method of manufacturing printed matter" was invented by Masaki Seki (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a defect inspection device, a defect inspection method, and a program, and a printing device and a method of manufacturing a printed matter, in which a defect of a printed matter is inspected by performing registration between reference data and imaging data of the printed matter printed on the basis of the reference data with high accuracy at high speed. T...