ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,566, issued on May 19, was assigned to FUJIFILM Corp. (Tokyo).
"Inspection support device, inspection support method, and program" was invented by Shuhei Horita (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are an inspection support device, an inspection support method, and a program capable of reducing complexity of creating a damage diagram. The inspection support device includes a processor that supports creation of a damage diagram of a structure, in which the processor acquires image data of information including a structural drawing of a target structure on a medium and damage information related to damage added by a user on th...