ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,593, issued on Feb. 24, was assigned to FUJIFILM Corp. (Tokyo).
"Analysis device and analysis method" was invented by Yoshinobu Miura (Kanagawa, Japan) and Yuki Arai (Kanagawa, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis device uses an analysis chip having two regions of a first region, which has a reagent reacting with a substance to be tested, and a second region, which does not have the reagent, and includes a first light source that irradiates the first region with light from a first surface side, a second light source that irradiates the second region with light from a second surface side, a first photodetector that detects...